1 // SPDX-License-Identifier: GPL-2.0+
2 /*
3 * Unit tests for event handling
4 *
5 * Copyright 2021 Google LLC
6 * Written by Simon Glass <sjg@chromium.org>
7 */
8
9 #include <common.h>
10 #include <dm.h>
11 #include <event.h>
12 #include <test/common.h>
13 #include <test/test.h>
14 #include <test/ut.h>
15
16 struct test_state {
17 struct udevice *dev;
18 int val;
19 };
20
h_adder(void * ctx,struct event * event)21 static int h_adder(void *ctx, struct event *event)
22 {
23 struct event_data_test *data = &event->data.test;
24 struct test_state *test_state = ctx;
25
26 test_state->val += data->signal;
27
28 return 0;
29 }
30
test_event_base(struct unit_test_state * uts)31 static int test_event_base(struct unit_test_state *uts)
32 {
33 struct test_state state;
34 int signal;
35
36 state.val = 12;
37 ut_assertok(event_register("wibble", EVT_TEST, h_adder, &state));
38
39 signal = 17;
40
41 /* Check that the handler is called */
42 ut_assertok(event_notify(EVT_TEST, &signal, sizeof(signal)));
43 ut_asserteq(12 + 17, state.val);
44
45 return 0;
46 }
47 COMMON_TEST(test_event_base, 0);
48
h_probe(void * ctx,struct event * event)49 static int h_probe(void *ctx, struct event *event)
50 {
51 struct test_state *test_state = ctx;
52
53 test_state->dev = event->data.dm.dev;
54 switch (event->type) {
55 case EVT_DM_PRE_PROBE:
56 test_state->val |= 1;
57 break;
58 case EVT_DM_POST_PROBE:
59 test_state->val |= 2;
60 break;
61 default:
62 break;
63 }
64
65 return 0;
66 }
67
test_event_probe(struct unit_test_state * uts)68 static int test_event_probe(struct unit_test_state *uts)
69 {
70 struct test_state state;
71 struct udevice *dev;
72
73 state.val = 0;
74 ut_assertok(event_register("pre", EVT_DM_PRE_PROBE, h_probe, &state));
75 ut_assertok(event_register("post", EVT_DM_POST_PROBE, h_probe, &state));
76
77 /* Probe a device */
78 ut_assertok(uclass_first_device_err(UCLASS_TEST_FDT, &dev));
79
80 /* Check that the handler is called */
81 ut_asserteq(3, state.val);
82
83 return 0;
84 }
85 COMMON_TEST(test_event_probe, UT_TESTF_DM | UT_TESTF_SCAN_FDT);
86