1 /* SPDX-License-Identifier: GPL-2.0+ */
2 /*
3 * Copyright (c) 2013 Google, Inc.
4 */
5
6 #ifndef __TEST_TEST_H
7 #define __TEST_TEST_H
8
9 #include <malloc.h>
10 #include <linux/bitops.h>
11
12 /*
13 * struct unit_test_state - Entire state of test system
14 *
15 * @fail_count: Number of tests that failed
16 * @skip_count: Number of tests that were skipped
17 * @start: Store the starting mallinfo when doing leak test
18 * @of_live: true to use livetree if available, false to use flattree
19 * @of_root: Record of the livetree root node (used for setting up tests)
20 * @root: Root device
21 * @testdev: Test device
22 * @force_fail_alloc: Force all memory allocs to fail
23 * @skip_post_probe: Skip uclass post-probe processing
24 * @fdt_chksum: crc8 of the device tree contents
25 * @fdt_copy: Copy of the device tree
26 * @fdt_size: Size of the device-tree copy
27 * @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
28 * @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
29 * @of_other: Live tree for the other FDT
30 * @runs_per_test: Number of times to run each test (typically 1)
31 * @force_run: true to run tests marked with the UT_TESTF_MANUAL flag
32 * @expect_str: Temporary string used to hold expected string value
33 * @actual_str: Temporary string used to hold actual string value
34 */
35 struct unit_test_state {
36 int fail_count;
37 int skip_count;
38 struct mallinfo start;
39 struct device_node *of_root;
40 bool of_live;
41 struct udevice *root;
42 struct udevice *testdev;
43 int force_fail_alloc;
44 int skip_post_probe;
45 uint fdt_chksum;
46 void *fdt_copy;
47 uint fdt_size;
48 void *other_fdt;
49 int other_fdt_size;
50 struct device_node *of_other;
51 int runs_per_test;
52 bool force_run;
53 char expect_str[512];
54 char actual_str[512];
55 };
56
57 /* Test flags for each test */
58 enum {
59 UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
60 UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
61 UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
62 UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
63 UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
64 UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
65 /* do extra driver model init and uninit */
66 UT_TESTF_DM = BIT(6),
67 UT_TESTF_OTHER_FDT = BIT(7), /* read in other device tree */
68 /*
69 * Only run if explicitly requested with 'ut -f <suite> <test>'. The
70 * test name must end in "_norun" so that pytest detects this also,
71 * since it cannot access the flags.
72 */
73 UT_TESTF_MANUAL = BIT(8),
74 UT_TESTF_ETH_BOOTDEV = BIT(9), /* enable Ethernet bootdevs */
75 UT_TESTF_SF_BOOTDEV = BIT(10), /* enable SPI flash bootdevs */
76 };
77
78 /**
79 * struct unit_test - Information about a unit test
80 *
81 * @name: Name of test
82 * @func: Function to call to perform test
83 * @flags: Flags indicated pre-conditions for test
84 */
85 struct unit_test {
86 const char *file;
87 const char *name;
88 int (*func)(struct unit_test_state *state);
89 int flags;
90 };
91
92 /**
93 * UNIT_TEST() - create linker generated list entry for unit a unit test
94 *
95 * The macro UNIT_TEST() is used to create a linker generated list entry. These
96 * list entries are enumerate tests that can be execute using the ut command.
97 * The list entries are used both by the implementation of the ut command as
98 * well as in a related Python test.
99 *
100 * For Python testing the subtests are collected in Python function
101 * generate_ut_subtest() by applying a regular expression to the lines of file
102 * u-boot.sym. The list entries have to follow strict naming conventions to be
103 * matched by the expression.
104 *
105 * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
106 * foo that can be executed via command 'ut foo bar' and is implemented in
107 * function foo_test_bar().
108 *
109 * @_name: concatenation of name of the test suite, "_test_", and the name
110 * of the test
111 * @_flags: an integer field that can be evaluated by the test suite
112 * implementation
113 * @_suite: name of the test suite concatenated with "_test"
114 */
115 #define UNIT_TEST(_name, _flags, _suite) \
116 ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
117 .file = __FILE__, \
118 .name = #_name, \
119 .flags = _flags, \
120 .func = _name, \
121 }
122
123 /* Get the start of a list of unit tests for a particular suite */
124 #define UNIT_TEST_SUITE_START(_suite) \
125 ll_entry_start(struct unit_test, ut_ ## _suite)
126 #define UNIT_TEST_SUITE_COUNT(_suite) \
127 ll_entry_count(struct unit_test, ut_ ## _suite)
128
129 /* Use ! and ~ so that all tests will be sorted between these two values */
130 #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
131 #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
132 #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
133
134 /* Sizes for devres tests */
135 enum {
136 TEST_DEVRES_SIZE = 100,
137 TEST_DEVRES_COUNT = 10,
138 TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
139
140 /* A few different sizes */
141 TEST_DEVRES_SIZE2 = 15,
142 TEST_DEVRES_SIZE3 = 37,
143 };
144
145 /**
146 * testbus_get_clear_removed() - Test function to obtain removed device
147 *
148 * This is used in testbus to find out which device was removed. Calling this
149 * function returns a pointer to the device and then clears it back to NULL, so
150 * that a future test can check it.
151 */
152 struct udevice *testbus_get_clear_removed(void);
153
154 #ifdef CONFIG_SANDBOX
155 #include <asm/state.h>
156 #include <asm/test.h>
157 #endif
158
arch_reset_for_test(void)159 static inline void arch_reset_for_test(void)
160 {
161 #ifdef CONFIG_SANDBOX
162 state_reset_for_test(state_get_current());
163 #endif
164 }
test_load_other_fdt(struct unit_test_state * uts)165 static inline int test_load_other_fdt(struct unit_test_state *uts)
166 {
167 int ret = 0;
168 #ifdef CONFIG_SANDBOX
169 ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
170 #endif
171 return ret;
172 }
173
174 /**
175 * Control skipping of time delays
176 *
177 * Some tests have unnecessay time delays (e.g. USB). Allow these to be
178 * skipped to speed up testing
179 *
180 * @param skip_delays true to skip delays from now on, false to honour delay
181 * requests
182 */
test_set_skip_delays(bool skip_delays)183 static inline void test_set_skip_delays(bool skip_delays)
184 {
185 #ifdef CONFIG_SANDBOX
186 state_set_skip_delays(skip_delays);
187 #endif
188 }
189
190 /**
191 * test_set_eth_enable() - Enable / disable Ethernet
192 *
193 * Allows control of whether Ethernet packets are actually send/received
194 *
195 * @enable: true to enable Ethernet, false to disable
196 */
test_set_eth_enable(bool enable)197 static inline void test_set_eth_enable(bool enable)
198 {
199 #ifdef CONFIG_SANDBOX
200 sandbox_set_eth_enable(enable);
201 #endif
202 }
203
204 /* Allow ethernet to be disabled for testing purposes */
test_eth_enabled(void)205 static inline bool test_eth_enabled(void)
206 {
207 bool enabled = true;
208
209 #ifdef CONFIG_SANDBOX
210 enabled = sandbox_eth_enabled();
211 #endif
212 return enabled;
213 }
214
215 /* Allow ethernet bootdev to be ignored for testing purposes */
test_eth_bootdev_enabled(void)216 static inline bool test_eth_bootdev_enabled(void)
217 {
218 bool enabled = true;
219
220 #ifdef CONFIG_SANDBOX
221 enabled = sandbox_eth_enabled();
222 #endif
223 return enabled;
224 }
225
226 /* Allow SPI flash bootdev to be ignored for testing purposes */
test_sf_bootdev_enabled(void)227 static inline bool test_sf_bootdev_enabled(void)
228 {
229 bool enabled = true;
230
231 #ifdef CONFIG_SANDBOX
232 enabled = sandbox_sf_bootdev_enabled();
233 #endif
234 return enabled;
235 }
236
test_sf_set_enable_bootdevs(bool enable)237 static inline void test_sf_set_enable_bootdevs(bool enable)
238 {
239 #ifdef CONFIG_SANDBOX
240 sandbox_sf_set_enable_bootdevs(enable);
241 #endif
242 }
243
244 #endif /* __TEST_TEST_H */
245