| /bsp/nv32f100x/lib/inc/ |
| A D | NV32_config.h | 13 #define TEST macro
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| /bsp/rm48x50/HALCoGen/include/ |
| A D | reg_can.h | 44 uint32 TEST; /**< 0x0014: Test Register */ member
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| /bsp/fm33lc026/libraries/FM/FM33xx/Include/ |
| A D | fm33lc0xx.h | 375 …__IO uint32_t TEST; /*!< LCD test Register, Address … member
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| A D | fm33lg0xx.h | 819 …__IO uint32_t TEST; /*!< LCD test Register, … member
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| /bsp/fm33lc026/libraries/FM33LC0xx_FL_Driver/CMSIS/Include/ |
| A D | fm33lc0xx.h | 375 …__IO uint32_t TEST; /*!< LCD test Register, Address … member
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| A D | fm33lg0xx.h | 819 …__IO uint32_t TEST; /*!< LCD test Register, … member
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| /bsp/ht32/libraries/HT32_STD_1xxxx_FWLib/library/Device/Holtek/HT32F1xxxx/Include/ |
| A D | ht32f1xxxx_01.h | 680 …__IO uint32_t TEST; /*!< 0x008 Test Register … member
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| /bsp/hpmicro/libraries/hpm_sdk/soc/HPM5300/ip/ |
| A D | hpm_mcan_regs.h | 17 __RW uint32_t TEST; /* 0x10: test register */ member
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| /bsp/hpmicro/libraries/hpm_sdk/soc/HPM6E00/ip/ |
| A D | hpm_mcan_regs.h | 17 __RW uint32_t TEST; /* 0x10: test register */ member
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| /bsp/microchip/samc21/bsp/samc21/include/component/ |
| A D | can.h | 218 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3039 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
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| /bsp/microchip/same54/bsp/include/component/ |
| A D | can.h | 218 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3039 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
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| /bsp/microchip/samd51-seeed-wio-terminal/bsp/samd51a/include/component/ |
| A D | can.h | 232 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3053 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
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| /bsp/microchip/samd51-adafruit-metro-m4/bsp/samd51a/include/component/ |
| A D | can.h | 232 uint32_t TEST:1; /*!< bit: 7 Test Mode Enable */ member
3053 __IO CAN_TEST_Type TEST; /**< \brief Offset: 0x10 (R/W 32) Test */ member
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| /bsp/hpmicro/libraries/hpm_sdk/soc/HPM6800/ip/ |
| A D | hpm_mcan_regs.h | 17 __RW uint32_t TEST; /* 0x10: test register */ member
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| /bsp/hpmicro/libraries/hpm_sdk/soc/HPM6200/ip/ |
| A D | hpm_mcan_regs.h | 17 __RW uint32_t TEST; /* 0x10: test register */ member
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| /bsp/fujitsu/mb9x/mb9bf506r/libraries/Device/FUJISTU/MB9BF50x/Include/ |
| A D | mb9bf506r.h | 4508 __IO uint32_t TEST : 1; member
4519 __IO uint32_t TEST : 1; member
4530 __IO uint32_t TEST : 1; member
4541 __IO uint32_t TEST : 1; member
4552 __IO uint32_t TEST : 1; member
4563 __IO uint32_t TEST : 1; member
4574 __IO uint32_t TEST : 1; member
4585 __IO uint32_t TEST : 1; member
5993 __IO uint16_t TEST : 1; member
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| /bsp/ht32/libraries/HT32_STD_5xxxx_FWLib/library/Device/Holtek/HT32F5xxxx/Include/ |
| A D | ht32f5xxxx_01.h | 1043 …__IO uint32_t TEST; /*!< 0x008 Test Register … member
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| /bsp/smartfusion2/CMSIS/ |
| A D | m2sxxx.h | 618 __IO uint32_t TEST; member
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| /bsp/microchip/same70/bsp/same70b/include/component/ |
| A D | mcan.h | 895 …uint32_t TEST:1; /**< bit: 7 Test Mode Enable (read/write, write protecti… member
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| /bsp/msp432e401y-LaunchPad/libraries/msp432e4/inc/ |
| A D | msp432e401y.h | 352 …__IO uint32_t TEST; /*!< Watchdog Test … member
847 …__IO uint8_t TEST; /*!< USB Test Mode … member
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| A D | msp432e411y.h | 361 …__IO uint32_t TEST; /*!< Watchdog Test … member
856 …__IO uint8_t TEST; /*!< USB Test Mode … member
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| /bsp/n32/libraries/N32G43x_Firmware_Library/CMSIS/device/ |
| A D | n32g43x.h | 318 __IO uint32_t TEST; member
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| /bsp/n32/libraries/N32L40x_Firmware_Library/CMSIS/device/ |
| A D | n32l40x.h | 320 __IO uint32_t TEST; member
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| /bsp/n32/libraries/N32L43x_Firmware_Library/CMSIS/device/ |
| A D | n32l43x.h | 320 __IO uint32_t TEST; member
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| /bsp/essemi/es32f369x/libraries/CMSIS/Device/EastSoft/ES32F36xx/Include/ |
| A D | es32f36xx.h | 8685 __IO uint8_t TEST; member
|