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/tests/drivers/pwm/pwm_loopback/src/
A Dtest_pwm_loopback.c88 pwm_disable_capture(in.dev, in.pwm); in test_capture()
176 err = pwm_capture_cycles(in.dev, in.pwm, in ZTEST_USER()
241 err = pwm_configure_capture(in.dev, in.pwm, in ZTEST()
259 err = pwm_enable_capture(in.dev, in.pwm); in ZTEST()
266 err = pwm_disable_capture(in.dev, in.pwm); in ZTEST()
306 err = pwm_configure_capture(in.dev, in.pwm, in.flags | flags, in ZTEST()
312 err = pwm_configure_capture(in.dev, in.pwm, in.flags | flags, in ZTEST()
319 err = pwm_enable_capture(in.dev, in.pwm); in ZTEST()
322 err = pwm_configure_capture(in.dev, in.pwm, in.flags | flags, in ZTEST()
326 err = pwm_enable_capture(in.dev, in.pwm); in ZTEST()
[all …]
A Dmain.c14 struct test_pwm in; in pwm_loopback_setup() local
17 get_test_pwms(&out, &in); in pwm_loopback_setup()
20 k_object_access_grant(in.dev, k_current_get()); in pwm_loopback_setup()
27 struct test_pwm in; in pwm_loopback_after() local
33 get_test_pwms(&out, &in); in pwm_loopback_after()
35 err = pwm_disable_capture(in.dev, in.pwm); in pwm_loopback_after()
/tests/posix/net/src/
A Dinet_ntoa.c14 struct in_addr in; in ZTEST() local
16 in.s_addr = htonl(0x7f000001); in ZTEST()
17 zassert_mem_equal(inet_ntoa(in), "127.0.0.1", strlen("127.0.0.1") + 1); in ZTEST()
19 in.s_addr = htonl(0); in ZTEST()
20 zassert_mem_equal(inet_ntoa(in), "0.0.0.0", strlen("0.0.0.0") + 1); in ZTEST()
22 in.s_addr = htonl(0xffffffff); in ZTEST()
23 zassert_mem_equal(inet_ntoa(in), "255.255.255.255", strlen("255.255.255.255") + 1); in ZTEST()
A Dinet_addr.c18 const char *in; in ZTEST() member
46 ret = inet_addr(p->in); in ZTEST()
47 zexpect_equal(ret, p->out, "inet_addr(%s) failed. expect: %d actual: %d", p->in, in ZTEST()
/tests/ztest/fail/
A DKconfig8 bool "Add a failed assert in the after phase"
11 bool "Add a failed assert in the teardown phase"
14 bool "Add a failed assume in the after phase"
17 bool "Add a failed assume in the teardown phase"
20 bool "Add a call to ztest_test_pass() in the after phase"
23 bool "Add a call to ztest_test_pass() in the teardown phase"
32 default "ERROR: cannot fail in test phase 'after()', bailing" if ZTEST_FAIL_TEST_ASSERT_AFTER
33 default "ERROR: cannot fail in test phase 'teardown()', bailing" if ZTEST_FAIL_TEST_ASSERT_TEARDOWN
36 …default "ERROR: cannot fail in test phase 'after()', bailing" if ZTEST_FAIL_TEST_ASSUME_AFTER && Z…
38 default "ERROR: cannot pass in test phase 'after()', bailing" if ZTEST_FAIL_TEST_PASS_AFTER
[all …]
/tests/arch/arm/arm_runtime_nmi/
A DREADME.txt34 Trigger NMI in 10s: 0 s
35 Trigger NMI in 10s: 1 s
36 Trigger NMI in 10s: 2 s
37 Trigger NMI in 10s: 3 s
38 Trigger NMI in 10s: 4 s
39 Trigger NMI in 10s: 5 s
40 Trigger NMI in 10s: 6 s
41 Trigger NMI in 10s: 7 s
42 Trigger NMI in 10s: 8 s
43 Trigger NMI in 10s: 9 s
/tests/net/lib/lwm2m/lwm2m_registry/src/
A Dlwm2m_registry.c142 memset(&name.in, GET_SET_UNINIT_PATTERN, sizeof(name.in)); \
208 sizeof(opaque.in))); in ZTEST()
210 sizeof(string.in))); in ZTEST()
223 zassert_equal(b.in, b.out); in ZTEST()
233 zassert_equal(t.in, t.out); in ZTEST()
234 zassert_equal(d.in, d.out); in ZTEST()
672 sizeof(opaque.in))); in ZTEST()
674 sizeof(string.in))); in ZTEST()
687 zassert_equal(b.in, b.out); in ZTEST()
697 zassert_equal(t.in, t.out); in ZTEST()
[all …]
/tests/posix/common/
A DKconfig11 This option is specific to posix_apis.test_realtime in clock.c
14 int "Time to sleep between iterations in milliseconds"
18 This option is specific to posix_apis.test_realtime in clock.c
21 int "Maximum overshoot (error) in milliseconds"
25 This option is specific to posix_apis.test_realtime in clock.c
28 int "Number of loops in semaphore test"
32 This option is specific to semaphore.test_named_semaphore in semaphore.c
/tests/posix/timers/
A DKconfig11 This option is specific to posix_apis.test_realtime in clock.c
14 int "Time to sleep between iterations in milliseconds"
18 This option is specific to posix_apis.test_realtime in clock.c
21 int "Maximum overshoot (error) in milliseconds"
25 This option is specific to posix_apis.test_realtime in clock.c
/tests/drivers/regulator/voltage/dts/bindings/
A Dtest-regulator-voltage.yaml6 tests/drivers/regulator/voltage test in Zephyr.
15 Regulators to be tested. Each entry must have a matching ADC entry in
22 ADC channels to be used. Each entry must have a matching entry in
31 require more, though. Each entry must have a matching entry in
50 Specifies the minimum voltage at which the test will run, in microvolts.
51 Used to filter out ranges that cannot be tested correctly in the configuration.
57 Specifies the maximum voltage at which the test will run, in microvolts.
58 Used to filter out ranges that cannot be tested correctly in the configuration.
/tests/bsim/bluetooth/host/misc/sample_test/
A DREADME.rst11 BabbleSim_ is :ref:`integrated in zephyr <bsim>` and used for testing the Bluetooth stack.
12 The tests are implemented in ``tests/bsim/bluetooth``.
16 test library, in order to de-duplicate code that is not relevant to the test in question. Things
19 Please don't use the ``bs_`` prefix in files or identifiers. It's meant to
25 Read in order:
/tests/drivers/gpio/gpio_basic_api/dts/bindings/
A Dtest-gpio-basic-api.yaml9 tests/drivers/gpio/gpio_basic_api test in Zephyr.
19 must be on the same device as in-gpios, and physically
20 connected to in-gpios.
22 in-gpios:
/tests/drivers/regulator/fixed/dts/bindings/
A Dtest-regulator-fixed.yaml6 tests/drivers/regulator/fixed test in Zephyr.
15 Identity of a GPIO that is shorted to the GPIO identified in the test
19 The active level in the flags cell of this must match the active level
20 of the flags cell in the regulator's enable-gpios property, and the
/tests/bsim/bluetooth/mesh/
A DREADME.rst9 subfolder of test_scripts contains tests for a specific module in the Bluetooth
15 harnesses in every build. The overlying bsim test framework selects the harness
16 to use at runtime, using the test identifiers passed in the test scripts.
22 procedure described in the parent folder.
32 ``RunTest`` to skip starting processes for each application in the ``$SKIPPED``
33 array, so that they can be started independently in gdb, valgrind or some other
39 Example: To debug the ``transport_tx_seg_block`` test harness in the transport
66 All test scripts in the Bluetooth Mesh BabbleSim test suite follow a common
69 function is called once in each script with the following parameters:
81 Common target side mesh behavior is collected in mesh_test.c and mesh_test.h.
[all …]
/tests/drivers/build_all/i3c/
A Dtestcase.yaml8 # will cover drivers without in-tree boards
13 # will cover drivers without in-tree boards
18 # will cover drivers without in-tree boards
/tests/drivers/watchdog/wdt_error_cases/
A DREADME.txt3 returns error code as described in the API documentation
7 However, it may happen that invalid function call results in
16 Since, coverage data is stored in the RAM, it is lost when watchdog fires.
17 Therefore, in all test cases watchdog shall NOT expire.
20 These tests were prepared on a target that had a bug in the wdt_disable()
48 a) List all supported flags in
52 b) Set supported flag in
54 This define will be used in wdt_install_timeout() "correct" test step.
71 a) List all supported options in
74 b) Set supported option(s) in
[all …]
/tests/bsim/bluetooth/
A Dtests.nrf52bsim.txt1 # Search paths(s) for tests which will be run in the nrf52bsim
2 # This file is used in CI to select which tests are run
/tests/subsys/edac/ibecc/
A DREADME.rst11 IBECC should be enabled in BIOS. This is usually enabled in the default
31 Additionally Error Injection need to be enabled in the following BIOS menu::
62 PASS - test_edac_dummy_api in 0.001 seconds
66 PASS - test_ibecc_initialized in 0.004 seconds
69 SKIP - test_ibecc_injection in 0.001 seconds
/tests/posix/semaphores/
A DKconfig5 int "Number of loops in semaphore test"
9 This option is specific to semaphore.test_named_semaphore in semaphore.c
/tests/drivers/spi/spi_loopback/
A DKconfig8 bool "Configure the SPI in LOOP mode, so that no extra wiring is needed"
25 bool "Enable this if nocache regions are defined in devicetree"
30 string "Name of the nocache region defined in devicetree (capitals)"
/tests/drivers/uart/uart_async_dual/
A DKconfig5 int "Single test case length (in milliseconds)"
6 # For the simulated devices, which are run by default in CI, we set it to less to not spend too
15 bool "Use runtime PM in the test"
/tests/kernel/fpu_sharing/generic/
A DCMakeLists.txt7 # Some boards are significantly slower than others resulting in the test
8 # output being in the range of every few seconds to every few minutes. To
9 # compensate for this, one can control the number of iterations in the PI
/tests/bluetooth/controller/ctrl_isoal/
A DKconfig39 Set the number of Isochronous Rx SDU fragments to be buffered in the
43 size of an SDU that can be accurately declared in the HCI ISO Data
47 int "Minimum number of playload data bytes in a new segment"
61 int "Margin (in microseconds) to be used in framed time offset for BIS"
71 int "Margin (in microseconds) to be used in framed time offset for CIS"
/tests/subsys/ipc/ipc_sessions/interoperability/
A DKconfig.icmsg_v116 int "Mutex lock timeout in milliseconds"
21 Maximum time to wait, in milliseconds, for access to send data with
25 int "Bond notification timeout in miliseconds"
41 Disabling this config may result in deadlocks in certain usage
66 The ICMSG library in its simplicity requires the workqueue to execute
71 # The Icmsg library in its simplicity requires the system workqueue to execute
87 int "Size of PBUF read buffer in bytes"
/tests/arch/arm/arm_thread_swap/
A DREADME.txt11 at thread swap-out and swap-in, respectively
13 restored, properly, at thread swap-out and swap-in, respectively,
18 at thread swap-in
29 The test is currently supported in ARM Cortex-M Baseline and Mainline
37 the mode in which a user thread is currently executing.
38 - threads in system calls are using the privileged thread stack
40 user threads in PRIV mode and supervisor threads
42 The test is currently supported in ARM Cortex-M Baseline and Mainline

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