| /tests/lib/smf/src/ |
| A D | test_lib_hierarchical_5_ancestor_smf.c | 66 static uint32_t test_value[] = { variable 131 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent 05 run failed"); in p05_run() 145 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent 05 exit failed"); in p05_exit() 167 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent 04 run failed"); in p04_run() 201 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Parent 03 run failed"); in p03_run() 303 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State A run failed"); in a_run() 317 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State A exit failed"); in a_exit() 339 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State B run failed"); in b_run() 351 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State B exit failed"); in b_exit() 373 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State C run failed"); in c_run() [all …]
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| A D | test_lib_hierarchical_smf.c | 68 static uint32_t test_value[] = { variable 215 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State A run failed"); in state_a_run() 249 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State B run failed"); in state_b_run() 288 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test State C run failed"); in state_c_run() 356 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 373 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 390 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 407 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 424 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 441 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() [all …]
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| A D | test_lib_flat_smf.c | 43 static uint32_t test_value[] = { variable 86 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_entry() 102 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_run() 116 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_a_exit() 127 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_entry() 138 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_run() 157 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_b_exit() 167 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_c_entry() 177 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_c_run() 190 zassert_equal(o->transition_bits, test_value[o->tv_idx], in state_c_exit() [all …]
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| A D | test_lib_self_transition_smf.c | 82 static uint32_t test_value[] = { variable 164 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Root entry failed"); in root_entry() 175 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Root run failed"); in root_run() 189 zassert_equal(o->transition_bits, test_value[o->tv_idx], "Test Root exit failed"); in root_exit() 481 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 499 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 517 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 535 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 553 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() 571 zassert_equal(test_obj.transition_bits, test_value[test_obj.tv_idx], in ZTEST() [all …]
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| /tests/kernel/common/src/ |
| A D | pow2.c | 56 static void test_pow2_ceil_x(unsigned long test_value, in test_pow2_ceil_x() argument 59 volatile unsigned int x = test_value; in test_pow2_ceil_x() 64 test_value, result, expected_result); in test_pow2_ceil_x()
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| /tests/subsys/edac/ibecc/src/ |
| A D | ibecc.c | 98 uint32_t test_value; in ZTEST() local 111 ret = edac_inject_get_error_type(dev, &test_value); in ZTEST() 113 zassert_equal(test_value, 0, "Error type not zero"); in ZTEST() 171 uint32_t test_value; in test_inject() local 196 ret = edac_inject_get_error_type(dev, &test_value); in test_inject() 198 zassert_equal(test_value, type, "Read back value differs"); in test_inject() 206 test_value = sys_read32(test_addr); in test_inject() 207 LOG_DBG("Read value 0x%llx: 0x%x", test_addr, test_value); in test_inject() 214 test_value = sys_read32(test_addr); in test_inject() 215 LOG_DBG("Read value 0x%llx: 0x%x", test_addr, test_value); in test_inject()
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| /tests/bluetooth/gatt/src/ |
| A D | main.c | 25 static uint8_t test_value[] = { 'T', 'e', 's', 't', '\0' }; variable 63 if (offset + len > sizeof(test_value)) { in write_test() 80 read_test, write_test, test_value), 163 read_test, write_test, test_value), in ZTEST() 228 read_test, write_test, test_value), in ZTEST() 291 read_test, write_test, test_value), in ZTEST() 391 test_value, 0, find_attr, &attr); in ZTEST() 394 zassert_equal(attr->user_data, test_value, in ZTEST() 440 zassert_equal(ret, strlen(test_value), in ZTEST() 442 zassert_mem_equal(buf, test_value, ret, in ZTEST() [all …]
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| /tests/drivers/fuel_gauge/lc709203f/src/ |
| A D | test_lc709203f.c | 181 uint8_t test_value = 5; in ZTEST_USER_F() local 184 .state_of_charge_alarm = test_value, in ZTEST_USER_F() 192 zassert_equal(state_of_charge_alarm_get.state_of_charge_alarm, test_value); in ZTEST_USER_F()
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| /tests/subsys/settings/fcb/src/ |
| A D | settings_test.h | 52 char test_value[SETTINGS_TEST_FCB_VAL_STR_CNT][SETTINGS_MAX_VAL_LEN],
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| A D | settings_test_fcb.c | 202 test_config_fill_area(char test_value[SETTINGS_TEST_FCB_VAL_STR_CNT] in test_config_fill_area() 210 test_value[j][i] = ((j * 2) + i + iteration) % 10 + '0'; in test_config_fill_area() 212 test_value[j][sizeof(test_value[j]) - 1] = '\0'; in test_config_fill_area()
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| /tests/bsim/bluetooth/host/gatt/settings/src/ |
| A D | gatt_utils.c | 31 static uint8_t test_value[] = { 'T', 'e', 's', 't', '\0' }; variable 60 if (offset + len > sizeof(test_value)) { in write_test() 77 read_test, write_test, test_value), 88 read_test, write_test, test_value),
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| /tests/drivers/fuel_gauge/sbs_gauge/src/ |
| A D | test_sbs_gauge.c | 246 uint16_t test_value = 0x1001; in ZTEST_USER_F() local 249 .sbs_mfr_access_word = test_value, in ZTEST_USER_F() 255 zassert_equal(mfr_acc_get.sbs_mfr_access_word, test_value); in ZTEST_USER_F()
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| /tests/drivers/sensor/adltc2990/src/ |
| A D | main.c | 362 float test_value = voltage_values[0].val1 + (float)voltage_values[0].val2 / 1000000; in ZTEST_F() local 364 zassert_between_inclusive(test_value, -0.16f, -0.159f, "Out of Range [-0.16,-0.159]%.6f", in ZTEST_F() 365 (double)test_value); in ZTEST_F() 367 test_value = voltage_values[1].val1 + (float)voltage_values[1].val2 / 1000000; in ZTEST_F() 368 zassert_between_inclusive(test_value, 2.69f, 2.7f, "Out of Range [2.69, 2.7]%.6f", in ZTEST_F() 369 (double)test_value); in ZTEST_F() 688 double test_value = voltage_values[4].val1 + (double)voltage_values[4].val2 / 1000000; in ZTEST_F() local 690 zassert_between_inclusive(test_value, 6.0, 6.1, "Out of Range [6.0,6.1] %.6f", in ZTEST_F() 691 (double)test_value); in ZTEST_F()
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